cross-sectional transmission electron microscopy (tem) specimens Search Results


fei helios nanolab 650 dualbeam focused ion beam (fib)  (NanoLab Inc)
90
NanoLab Inc fei helios nanolab 650 dualbeam focused ion beam (fib)
Fei Helios Nanolab 650 Dualbeam Focused Ion Beam (Fib), supplied by NanoLab Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/cross-sectional+transmission+electron+microscopy+(tem)+specimens/focused+ion+beam/10__1016_slash_j__oceram__2024__100698-80-12-13
Average 90 stars, based on 1 article reviews
fei helios nanolab 650 dualbeam focused ion beam (fib) - by Bioz Stars, 2026-09
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electron elastic scattering cross section database  (National Institute of Standards and Technology)
90
National Institute of Standards and Technology electron elastic scattering cross section database
Electron Elastic Scattering Cross Section Database, supplied by National Institute of Standards and Technology, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Average 90 stars, based on 1 article reviews
electron elastic scattering cross section database - by Bioz Stars, 2026-09
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cross sectional transmission electron microscopy xtem  (JEOL)
99
JEOL cross sectional transmission electron microscopy xtem
( a ) Cross-sectional transmission electron <t>microscopy</t> <t>(XTEM)</t> image of the virgin sample, ( b – d ) the indexed selected area electron diffraction (SAED) patterns taken from the area of the top, middle and bottom of the LNO thin film in the virgin sample, respectively. ( e ) XTEM image of the sample with He implantation fluence of 1E14 cm −2 , ( f – h ) the indexed SAED patterns taken from the area of the top, middle and bottom of the LNO thin film in the sample with He implantation fluence of 1E14 cm −2 , respectively.
Cross Sectional Transmission Electron Microscopy Xtem, supplied by JEOL, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/cross-sectional+transmission+electron+microscopy+(tem)+specimens/JEM-2100F+Transmission+Electron+Microscope/pmc06911103-48-23-30
Average 99 stars, based on 1 article reviews
cross sectional transmission electron microscopy xtem - by Bioz Stars, 2026-09
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microscopy om  (JEOL)
97
JEOL microscopy om
( a ) Cross-sectional transmission electron <t>microscopy</t> <t>(XTEM)</t> image of the virgin sample, ( b – d ) the indexed selected area electron diffraction (SAED) patterns taken from the area of the top, middle and bottom of the LNO thin film in the virgin sample, respectively. ( e ) XTEM image of the sample with He implantation fluence of 1E14 cm −2 , ( f – h ) the indexed SAED patterns taken from the area of the top, middle and bottom of the LNO thin film in the sample with He implantation fluence of 1E14 cm −2 , respectively.
Microscopy Om, supplied by JEOL, used in various techniques. Bioz Stars score: 97/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/cross-sectional+transmission+electron+microscopy+(tem)+specimens/JXA-8530F+Electron+Probe+Microanalyzer/10__3390_slash_met12030453-57-13-20
Average 97 stars, based on 1 article reviews
microscopy om - by Bioz Stars, 2026-09
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cross sectional lamellae  (JEOL)
99
JEOL cross sectional lamellae
( a ) Cross-sectional transmission electron <t>microscopy</t> <t>(XTEM)</t> image of the virgin sample, ( b – d ) the indexed selected area electron diffraction (SAED) patterns taken from the area of the top, middle and bottom of the LNO thin film in the virgin sample, respectively. ( e ) XTEM image of the sample with He implantation fluence of 1E14 cm −2 , ( f – h ) the indexed SAED patterns taken from the area of the top, middle and bottom of the LNO thin film in the sample with He implantation fluence of 1E14 cm −2 , respectively.
Cross Sectional Lamellae, supplied by JEOL, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/cross-sectional+transmission+electron+microscopy+(tem)+specimens/JEM-F200+Transmission+Electron+Microscope/pm36996804-257-1-8
Average 99 stars, based on 1 article reviews
cross sectional lamellae - by Bioz Stars, 2026-09
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sem eds analysis  (JEOL)
97
JEOL sem eds analysis
( a ) Cross-sectional transmission electron <t>microscopy</t> <t>(XTEM)</t> image of the virgin sample, ( b – d ) the indexed selected area electron diffraction (SAED) patterns taken from the area of the top, middle and bottom of the LNO thin film in the virgin sample, respectively. ( e ) XTEM image of the sample with He implantation fluence of 1E14 cm −2 , ( f – h ) the indexed SAED patterns taken from the area of the top, middle and bottom of the LNO thin film in the sample with He implantation fluence of 1E14 cm −2 , respectively.
Sem Eds Analysis, supplied by JEOL, used in various techniques. Bioz Stars score: 97/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/cross-sectional+transmission+electron+microscopy+(tem)+specimens/JSM-7001F+Scanning+Electron+Microscope/10__1016_slash_j__jmrt__2022__12__022-86-14-17
Average 97 stars, based on 1 article reviews
sem eds analysis - by Bioz Stars, 2026-09
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field-emission scanning electron microscope  (AMO GmbH)
90
AMO GmbH field-emission scanning electron microscope
( a ) Cross-sectional transmission electron <t>microscopy</t> <t>(XTEM)</t> image of the virgin sample, ( b – d ) the indexed selected area electron diffraction (SAED) patterns taken from the area of the top, middle and bottom of the LNO thin film in the virgin sample, respectively. ( e ) XTEM image of the sample with He implantation fluence of 1E14 cm −2 , ( f – h ) the indexed SAED patterns taken from the area of the top, middle and bottom of the LNO thin film in the sample with He implantation fluence of 1E14 cm −2 , respectively.
Field Emission Scanning Electron Microscope, supplied by AMO GmbH, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/cross-sectional+transmission+electron+microscopy+(tem)+specimens/field+emission+scanning+electron+microscope/pmc03013076-72-9-16
Average 90 stars, based on 1 article reviews
field-emission scanning electron microscope - by Bioz Stars, 2026-09
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field emission scanning electron microscopy  (Hitachi Ltd)
99
Hitachi Ltd field emission scanning electron microscopy
( a ) Cross-sectional transmission electron <t>microscopy</t> <t>(XTEM)</t> image of the virgin sample, ( b – d ) the indexed selected area electron diffraction (SAED) patterns taken from the area of the top, middle and bottom of the LNO thin film in the virgin sample, respectively. ( e ) XTEM image of the sample with He implantation fluence of 1E14 cm −2 , ( f – h ) the indexed SAED patterns taken from the area of the top, middle and bottom of the LNO thin film in the sample with He implantation fluence of 1E14 cm −2 , respectively.
Field Emission Scanning Electron Microscopy, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/cross-sectional+transmission+electron+microscopy+(tem)+specimens/SU8600/pmc10003942-40-12-19
Average 99 stars, based on 1 article reviews
field emission scanning electron microscopy - by Bioz Stars, 2026-09
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sem hitachi tm3000 scanning electron microscopy  (Hitachi Ltd)
99
Hitachi Ltd sem hitachi tm3000 scanning electron microscopy
( a ) Cross-sectional transmission electron <t>microscopy</t> <t>(XTEM)</t> image of the virgin sample, ( b – d ) the indexed selected area electron diffraction (SAED) patterns taken from the area of the top, middle and bottom of the LNO thin film in the virgin sample, respectively. ( e ) XTEM image of the sample with He implantation fluence of 1E14 cm −2 , ( f – h ) the indexed SAED patterns taken from the area of the top, middle and bottom of the LNO thin film in the sample with He implantation fluence of 1E14 cm −2 , respectively.
Sem Hitachi Tm3000 Scanning Electron Microscopy, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/cross-sectional+transmission+electron+microscopy+(tem)+specimens/TM4000/10__3390_slash_coatings10090807-40-11-11
Average 99 stars, based on 1 article reviews
sem hitachi tm3000 scanning electron microscopy - by Bioz Stars, 2026-09
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2100 transmission electron microscope  (JEOL)
99
JEOL 2100 transmission electron microscope
( a ) Cross-sectional transmission electron <t>microscopy</t> <t>(XTEM)</t> image of the virgin sample, ( b – d ) the indexed selected area electron diffraction (SAED) patterns taken from the area of the top, middle and bottom of the LNO thin film in the virgin sample, respectively. ( e ) XTEM image of the sample with He implantation fluence of 1E14 cm −2 , ( f – h ) the indexed SAED patterns taken from the area of the top, middle and bottom of the LNO thin film in the sample with He implantation fluence of 1E14 cm −2 , respectively.
2100 Transmission Electron Microscope, supplied by JEOL, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/cross-sectional+transmission+electron+microscopy+(tem)+specimens/JEM-2100+Transmission+Electron+Microscope/pm28351995-187-15-19
Average 99 stars, based on 1 article reviews
2100 transmission electron microscope - by Bioz Stars, 2026-09
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jsm 6460lv scanning electron microscope  (JEOL)
96
JEOL jsm 6460lv scanning electron microscope
( a ) Cross-sectional transmission electron <t>microscopy</t> <t>(XTEM)</t> image of the virgin sample, ( b – d ) the indexed selected area electron diffraction (SAED) patterns taken from the area of the top, middle and bottom of the LNO thin film in the virgin sample, respectively. ( e ) XTEM image of the sample with He implantation fluence of 1E14 cm −2 , ( f – h ) the indexed SAED patterns taken from the area of the top, middle and bottom of the LNO thin film in the sample with He implantation fluence of 1E14 cm −2 , respectively.
Jsm 6460lv Scanning Electron Microscope, supplied by JEOL, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/cross-sectional+transmission+electron+microscopy+(tem)+specimens/JSM-6460_6460LV+Scanning+Electron+Microscope/pm17100910-33-14-19
Average 96 stars, based on 1 article reviews
jsm 6460lv scanning electron microscope - by Bioz Stars, 2026-09
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7800f field emission gun scanning electron microscope  (JEOL)
99
JEOL 7800f field emission gun scanning electron microscope
( a ) Cross-sectional transmission electron <t>microscopy</t> <t>(XTEM)</t> image of the virgin sample, ( b – d ) the indexed selected area electron diffraction (SAED) patterns taken from the area of the top, middle and bottom of the LNO thin film in the virgin sample, respectively. ( e ) XTEM image of the sample with He implantation fluence of 1E14 cm −2 , ( f – h ) the indexed SAED patterns taken from the area of the top, middle and bottom of the LNO thin film in the sample with He implantation fluence of 1E14 cm −2 , respectively.
7800f Field Emission Gun Scanning Electron Microscope, supplied by JEOL, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/cross-sectional+transmission+electron+microscopy+(tem)+specimens/JSM-7800F+Scanning+Electron+Microscope/10__1016_slash_j__tsf__2016__12__026-67-13-12
Average 99 stars, based on 1 article reviews
7800f field emission gun scanning electron microscope - by Bioz Stars, 2026-09
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Image Search Results


( a ) Cross-sectional transmission electron microscopy (XTEM) image of the virgin sample, ( b – d ) the indexed selected area electron diffraction (SAED) patterns taken from the area of the top, middle and bottom of the LNO thin film in the virgin sample, respectively. ( e ) XTEM image of the sample with He implantation fluence of 1E14 cm −2 , ( f – h ) the indexed SAED patterns taken from the area of the top, middle and bottom of the LNO thin film in the sample with He implantation fluence of 1E14 cm −2 , respectively.

Journal: Scientific Reports

Article Title: Engineering of self-rectifying filamentary resistive switching in LiNbO 3 single crystalline thin film via strain doping

doi: 10.1038/s41598-019-55628-3

Figure Lengend Snippet: ( a ) Cross-sectional transmission electron microscopy (XTEM) image of the virgin sample, ( b – d ) the indexed selected area electron diffraction (SAED) patterns taken from the area of the top, middle and bottom of the LNO thin film in the virgin sample, respectively. ( e ) XTEM image of the sample with He implantation fluence of 1E14 cm −2 , ( f – h ) the indexed SAED patterns taken from the area of the top, middle and bottom of the LNO thin film in the sample with He implantation fluence of 1E14 cm −2 , respectively.

Article Snippet: The crystalline quality and microstructure of the LNO thin film were examined by X-ray diffraction (XRD) with a Philips X’Pert X-ray diffractometer and cross-sectional transmission electron microscopy (XTEM) with a JEOL 2100 F field-emission transmission electron microscopy.

Techniques: Transmission Assay, Electron Microscopy